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  • Semiconductor devices - Neuromorphic devices - Part 1: Evaluation method of basic characteristics in memristor devices (IEC 47/2943/CDV:2025); German and English version prEN IEC 63550-1:2025

    Draft standard [PRE-ORDER] 2026-05

    DIN EN IEC 63550-1:2026-05; VDE 0884-3550-1:2026-05 - Draft

    Semiconductor devices - Neuromorphic devices - Part 1: Evaluation method of basic characteristics in memristor devices (IEC 47/2943/CDV:2025); German and English version prEN IEC 63550-1:2025

    22.30 EUR VAT included

    20.84 EUR VAT excluded

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  • Semiconductor devices - Neuromorphic devices - Part 2: Evaluation method of linearity in memristor devices (IEC 47/2942/CDV:2025); German and English version prEN IEC 63550-2:2025

    Draft standard [PRE-ORDER] 2026-05

    DIN EN IEC 63550-2:2026-05; VDE 0884-3550-2:2026-05 - Draft

    Semiconductor devices - Neuromorphic devices - Part 2: Evaluation method of linearity in memristor devices (IEC 47/2942/CDV:2025); German and English version prEN IEC 63550-2:2025

    22.30 EUR VAT included

    20.84 EUR VAT excluded

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  • Semiconductor devices - Neuromorphic devices - Part 3: Evaluation method of spike dependent plasticity in memristor devices (IEC 47/2941/CDV:2025); German and English version prEN IEC 63550-3:2025

    Draft standard [PRE-ORDER] 2026-05

    DIN EN IEC 63550-3:2026-05; VDE 0884-3550-3:2026-05 - Draft

    Semiconductor devices - Neuromorphic devices - Part 3: Evaluation method of spike dependent plasticity in memristor devices (IEC 47/2941/CDV:2025); German and English version prEN IEC 63550-3:2025

    24.38 EUR VAT included

    22.79 EUR VAT excluded

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  • Semiconductor devices - Neuromorphic devices - Part 4: Evaluation method of asymmetry in memristor devices (IEC 47/2940/CDV:2025); German and English version prEN IEC 63550-4:2025

    Draft standard [PRE-ORDER] 2026-05

    DIN EN IEC 63550-4:2026-05; VDE 0884-3550-4:2026-05 - Draft

    Semiconductor devices - Neuromorphic devices - Part 4: Evaluation method of asymmetry in memristor devices (IEC 47/2940/CDV:2025); German and English version prEN IEC 63550-4:2025

    20.08 EUR VAT included

    18.77 EUR VAT excluded

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  • Internet based identifier (IBI) generation system

    Standard [NEW] 2026-01-22

    ABNT NBR 16066:2026-01-22

    Internet based identifier (IBI) generation system

    from 79.70 EUR VAT included

    from 74.49 EUR VAT excluded

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  • Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devices

    Technical rule [CURRENT] 2022-10

    EIA JEP 160A:2022-10

    Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devices

    Information

    This item will be ordered specially for you, therefore delivery may take 1 to 2 weeks.

    Price on request

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  • JC-42.6 Manufacturer Identification (ID) Code for Low Power Memories

    Technical rule [CURRENT] 2025-07

    EIA JEP 166F:2025-07

    JC-42.6 Manufacturer Identification (ID) Code for Low Power Memories

    Information

    This item will be ordered specially for you, therefore delivery may take 1 to 2 weeks.

    Price on request

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  • NEAR-TERM DRAM LEVEL ROWHAMMER MITIGATION

    Technical rule [CURRENT] 2021-03

    EIA JEP 300-1:2021-03

    NEAR-TERM DRAM LEVEL ROWHAMMER MITIGATION

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    This item will be ordered specially for you, therefore delivery may take 1 to 2 weeks.

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  • 1.25 V DDR3U-800, DDR3U-1066, DDR3U-1333, and DDR3U-1600

    Standard [CURRENT] 2011-10

    EIA JESD 79-3-2:2011-10

    1.25 V DDR3U-800, DDR3U-1066, DDR3U-1333, and DDR3U-1600

    Information

    This item will be ordered specially for you, therefore delivery may take 1 to 2 weeks.

    Price on request

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  • Addendum No. 1 to JESD79-4, 3D Stacked DRAM

    Standard [CURRENT] 2021-02

    EIA JESD 79-4-1B:2021-02

    Addendum No. 1 to JESD79-4, 3D Stacked DRAM

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    This item will be ordered specially for you, therefore delivery may take 1 to 2 weeks.

    Price on request

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