Semiconductor devices - Neuromorphic devices - Part 3: Evaluation method of spike dependent plasticity in memristor devices (IEC 47/2941/CDV:2025); German and English version prEN IEC 63550-3:2025

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DIN EN IEC 63550-3:2026-05 - Draft

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Semiconductor devices - Neuromorphic devices - Part 3: Evaluation method of spike dependent plasticity in memristor devices (IEC 47/2941/CDV:2025); German and English version prEN IEC 63550-3:2025

German title
Halbleiterbauelemente - Neuromorphe Bauelemente - Teil 3: Bewertungsmethode für spikeabhängige Plastizität in Memristor-Bauelementen (IEC 47/2941/CDV:2025); Deutsche und Englische Fassung prEN IEC 63550-3:2025
Date of issue
2026-04-03
Publication date
2026-05
Original language
German, English
Pages
46

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Date of issue
2026-04-03
Publication date
2026-05
Original language
German, English
Pages
46

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