Semiconductor devices - Neuromorphic devices - Part 2: Evaluation method of linearity in memristor devices (IEC 47/2942/CDV:2025); German and English version prEN IEC 63550-2:2025

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DIN EN IEC 63550-2:2026-05 - Draft

VDE 0884-3550-2:2026-05

Semiconductor devices - Neuromorphic devices - Part 2: Evaluation method of linearity in memristor devices (IEC 47/2942/CDV:2025); German and English version prEN IEC 63550-2:2025

German title
Halbleiterbauelemente - Neuromorphe Bauelemente - Teil 2: Bewertungsmethode für die Linearität in Memristor-Bauelementen (IEC 47/2942/CDV:2025); Deutsche und Englische Fassung prEN IEC 63550-2:2025
Date of issue
2026-04-03
Publication date
2026-05
Original language
German, English
Pages
36

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Date of issue
2026-04-03
Publication date
2026-05
Original language
German, English
Pages
36

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