Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 47/2863/CDV:2024); German and English version prEN IEC 60749-24:2024

Draft standard

DIN EN IEC 60749-24:2025-04 - Draft

VDE 0884-749-24:2025-04

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 47/2863/CDV:2024); German and English version prEN IEC 60749-24:2024

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 24: Beschleunigte Verfahren für Feuchtebeständigkeit - Hochbeschleunigte Wirkung (HAST) ohne elektrische Beanspruchung (IEC 47/2863/CDV:2024); Deutsche und Englische Fassung prEN IEC 60749-24:2024
Date of issue
2025-03-28
Publication date
2025-04
Original language
German, English
Pages
17

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Date of issue
2025-03-28
Publication date
2025-04
Original language
German, English
Pages
17

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