Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)

Standard [CURRENT]

UNE-EN IEC 60749-10:2022-07-01

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)

Publication date
2022-07-01
Original language
English
Pages
20

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Publication date
2022-07-01
Original language
English
Pages
20

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