Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (( IEC 60749-28:2022) EN IEC 60749-28:2022) (german version)

Standard [CURRENT]

OVE EN IEC 60749-28:2025-01-01

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (( IEC 60749-28:2022) EN IEC 60749-28:2022) (german version)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level (( IEC 60749-28:2022) EN IEC 60749-28:2022) (deutsche Fassung)
Publication date
2025-01-01
Original language
German
Pages
50

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Publication date
2025-01-01
Original language
German
Pages
50

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