Requirements for Automated Inspection Process Control for IC Substrates

Standard [NEW]

IPC 9712:2026-04-01

Requirements for Automated Inspection Process Control for IC Substrates

Publication date
2026-04-01
Original language
English
Pages
17

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Publication date
2026-04-01
Original language
English
Pages
17
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Short description

IPC-9712 standard provides requirements for automated inspection systems — automated optical inspection (AOI), automated visual inspection (AVI), and metrology — to define, set up, establish, and apply process control for manufacturing integrated chip substrates, including general and specific process and equipment conditions in addition to the generic requirements of IPC‑9711.IPC-9712 requirements include those for operating and inspection parameters, vision systems, lighting conditions, calibration, detectability, resolution, threshold limits, process windows, program setups, measurement system analysis (MSA), maintenance, and verification protocols.
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