Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

Standard [CURRENT]

ASTM E 995:2025

Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

Publication date
2025
Original language
English
Pages
6
Note
The publisher recommends this document in lieu of the withdrawn document ASTM E 995:2016 , for which no replacement is available.

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Publication date
2025
Original language
English
Pages
6
Note
The publisher recommends this document in lieu of the withdrawn document ASTM E 995:2016 , for which no replacement is available.
DOI
https://dx.doi.org/10.1520/E0995-25

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Short description

1.1 The purpose of this guide is to familiarize the analyst with the principal background subtraction techniques presently in use together with the nature of their application to data acquisition and manipulation. 1.2 This guide is intended to apply to background subtraction in electron, X-ray, and ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS). 1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ICS

17.180.30

DOI

https://dx.doi.org/10.1520/E0995-25
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