Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies balanced-type circular disk resonator method

Draft standard

PR NF C90-316 - Draft

PR NF EN IEC 63616

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies balanced-type circular disk resonator method

Original language
English, French
Pages
26

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Original language
English, French
Pages
26

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