Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies balanced-type circular disk resonator method (IEC 46F/697/CDV) (english version)

Draft standard

OVE EN IEC 63616:2025-04-01 - Draft

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies balanced-type circular disk resonator method (IEC 46F/697/CDV) (english version)

Publication date
2025-04-01
Original language
English
Pages
16

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Publication date
2025-04-01
Original language
English
Pages
16

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